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中安
中安
BTI-E3300(Memory)
Memory High Temp.Burn-in System

Design for various packages' FLASH, SRAM, DRAM(Synchronous dynamic random access

memory),DDR(Double rate SDRAM),RDRAM,etc. running operation life test and

high temp.dynamic burn-in screening, as well as supporting of TDBI function.

Features:

1,Outstanding editing ability of MEMORY burn-in test pattern 

2,Testing each unit and recording failure one.



Custom&Dedicated Equipment

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